XMF-104
The XMF-104 uses a two-stage Peltier cooled, compact Si-PIN detector. This reduces the dimensions of the instrument significantly and also eliminates the need for cooling of the detector with liquid nitrogen.
- Precise, fast and reliable micro EDXRF analysis
- Compact table-top design
- High intensity X-Ray spot using Kumakhov focusing polycapillary optics
- Maintenance free, lightweight and userfriendly operation
- Qualitative and quantitative micro analysis of varied materials
- LCD display with membrane key-pads for device settings
- Measurement range: ppm to 100%
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SPECIFICATIONS |
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| ED-XRF | |
| X-Ray Generator | 50 W |
| Element range | Al (Nr. 13) to U (Nr. 92) |
| Focal spot size | <100 μm |
| Cooling method | Forced air |
| Sample positioning | Optical Microscope, assisted by dual laser beams |
| Maximum sample size | 50 (diameter) x 30 (H) mm |
| Type of samples | Solid, powder and fil |
